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Circuit Testing

High Resolution Time Domain Reflectometer

April 9, 2015 4:53 pm | by Megger | Product Releases | Comments

Megger, a manufacturer and supplier of test equipment and measuring instruments for electrical power applications, now offers the TDR2010, a dual channel, high resolution time domain reflectometer (TDR) for locating faults on all metallic cables, including twisted pair wires...

LISTED UNDER: Circuit Testing

EMC Probe Kit

February 11, 2015 3:23 pm | by Saelig Company, Inc. | Saelig Company, Inc. | Product Releases | Comments

The TBPS01-TBWA2 EMC Probe Kit includes investigative near-field probes and a wideband amplifier to increase the versatility of economical spectrum analyzers to identify EMC issues. The economical TBPS01-TBWA2 EMC Probe Kit consists of four rubber-handled near-field probes (three H-field and one E-field), a 20dB or a...

LISTED UNDER: Analyzers | Circuit Testing

Test Module Offered in 16-Channel Version

March 17, 2009 11:13 am | Product Releases | Comments

A 16-channel version of the SerDes Test Modules for VPX systems is available. The modules allow testing and pre-emphasis of the SerDes signals to ensure signal performance of the system. The 16-channel SerDes modules are designed to plug into VPX backplanes and directly test the channel compliance.

LISTED UNDER: Circuit Testing
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