Thu, 03/04/2004 - 5:50am
The µCT-50 X-ray inspection system combines high-power microfocus 2D X-ray technology with state-of-the-art 3D Computed Tomography techniques and high-end volume rendering software. It performs the detailed inspection and analysis of complex mechanical and electro-mechanical devices in the 3rd dimension. Combining the flexibility, functionality, and ergonomics of a standard microfocus X-ray system with the ability to generate 3D imagery, the µCT-50 system visualizes the most inner components and precise structural modeling of a device. Cracks, voids, and other crucial anomalies can now be depicted in their actual 3D position, providing valuable insight into the design and manufacturing processes of these devices.