Product Releases

Socket Enables Testing of Serial to Parallel Data Convertor

Thu, 08/26/2010 - 8:00am


Socket Enables Testing of Serial to Parallel Data ConvertorIronwood Electronics recently introduced a new stamped spring pin socket addressing high performance requirements for testing UART serial to parallel data convertor, CBT-QFN-7002. The contactor is a stamped spring pin with 26 gram actuation force per ball and cycle life of 500,000 insertions. The self inductance of the contactor is 0.88 nH, insertion loss <1 dB at 15.7 GHz and capacitance 0.097 pF. The current capacity of each contactor is 4 amps at 80°C temperature rise. Socket temperature range is -55 to 180°C. Socket also features a low profile snap lid for ease of operation. It also has a wave spring with swivel compression plate for vertical force without distorting device position. The specific configuration of the package to be tested in the CBT-QFN-7002 is a QFN, 7 x 7 mm, 0.5-mm pitch, 48 positions with center ground pad. The socket is mounted using supplied hardware on the target PCB with no soldering, and uses the smallest footprint in the industry. The smallest footprint allows inductors, resistors, and decoupling capacitors to be placed very close to the device for impedance tuning. To use, place QFN device into the socket and close the lid by snapping to the latch. This socket can be used for quick device screening and data conversion functional test applications with the most stringent requirements.

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