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Electrical Safety Compliance Analyzer Has Color TFT Display

Fri, 06/17/2011 - 6:57am

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Electrical Safety Compliance Analyzer Has Color TFT DisplayAnnounced by Associated Research, Inc is the release of the OMNIA II model 8204. OMNIA II is the second generation of Associated Research’s successful line of Electrical Safety Compliance Analyzers. The 8204 is a 4-in-1 Electrical Safety Compliance Analyzer that offers AC Hipot, DC Hipot, Insulation Resistance, and Ground Bond Testing in a single chassis. While building upon a proven platform, OMNIA II is equipped with several new and improved features and functions. OMNIA II includes an 800 x 480 Color TFT display that makes setting up test files, viewing results, and performing tests easier than ever. Color-coded test steps clearly indicate pass/fail conditions and users can also choose from 4 different color schemes to match their preferences. The 8204 is also equipped with an exclusive "My Menu" interface which allows operators to personalize menu settings, and create shortcuts to favorite screens and preferences. In addition, model 8204 includes Associated Research Inc’s DualCHEK™ feature, which allows the user to perform simultaneous Hipot and Ground Bond tests. This can safely increase productivity and throughput on the production line. The 8204 comes standard with a USB/RS-232 interface. Optional Ethernet, GPIB, Data Storage, and printer output interfaces are available.

Additional features of the OMNIA II 8204 are as follows:

  • Multiple language settings: English, Chinese, Spanish, Portuguese, and Turkish
  • Phase lock capability for safe and effective “Hot” Hipot testing
  • Up to 10,000 test steps for multiple programmable memory/step combinations
  • Patented SmartGFI® high speed shutdown circuit that provides maximum operator protection
  • Patented Prompt and Hold function inserts prompts or instructions as part of the test cycle
  • Patented CAL-ALERT® feature automatically alerts the user when the instrument is due for calibration
  • Patented VERI-CHEK® feature verifies that an instrument's failure detectors are functioning properly
  • Charge-LO® circuit confirms that the DUT is connected when performing a test
  • Ramp-HI® feature allows a user to charge the DUT as rapidly as possible without causing false failures
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