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KLA-Tencor Corporation (NASDAQ: KLAC), the world’s leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced its new Candela® 8620 substrate and epitaxy (epi) wafer inspection system. Designed for high brightness light emitting diode (HBLED) manufacturers, the Candela 8620 provides automated defect inspection for LED materials such as gallium nitride, sapphire, and silicon carbide—enabling enhanced quality control of both opaque and transparent substrates, faster time-to-root cause, and improved Metal Organic Chemical Vapor Deposition (MOCVD) reactor uptime and yield.

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