In response to the growing applications of electromechanical imaging and spectroscopy, this piezo force module enables very high sensitivity, high bias, and crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. It is exclusively available for the MFP-3D Atomic Force Microscope. The module enables high voltage PFM measurements and advanced imaging modes for characterizing the sample material. With it, a bias is applied to the AFM tip using proprietary electronics, a high voltage cantilever, and sample holder. The vertical and lateral response amplitude measures the local electromechanical activity of the surface, and the phase of the response yields information on the polarization direction.