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These RF test sockets are designed for devices up to 13 mm wide, with pitches of 0.5 mm and higher, in applications with speeds from 1 GHz to over 10 GHz. The socket's signal path during test is only 0.077 in., providing minimal signal loss for higher bandwidth capability and a longer cycle life in automated handler testing. A 4-point spring probe crown ensures scrub on solder ball oxides for reliable contact mating.
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