These gold plated bellows contacts are an alternative to spring-loaded type test pins for the next generation of high frequency test applications. The contact springs are manufactured from electrodeposited nickel and gold according to ASTM-B-488 to enhance their conductivity, and provide extremely low DC resistance with a minimum of insertion loss. Typical bellows have a loss of 0.2 dB (shorter) to 0.45 dB (longer) at 6 GHz with a total bandwidth much higher. Mechanically, the advantages include one piece construction, a size of 0.02? in diameter, and the ability to be coated with noise reduction materials to reduce crosstalk.