Mahr Federal has introduced two new optical surface measuring systems designed to provide fast non-contact 3D scanning and evaluation of very small to medium sized surface details on a wide range of components, including optics. The MarSurf WM 100 uses a white light interferometer, and the MarSurf CWM 100 includes both white light and confocal microscopy. The systems are designed for the measurement of optical, technical and reflecting surfaces, and to provide 3D topographical analysis where high information density is required, such as printed circuit boards.
The MarSurf CWM 100 and WM 100 provide highly accurate, non-contact measurement of surface structures with sub-nanometer resolution. Confocal microscopy is more adept at the measurement of dark surface structures, including the edges of small components, while white light interferometry is better suited to highly polished, shiny surfaces, including glass and optical surfaces.
For more information, visit www.mahr.com.