Watlow recently announced that its EZ-ZONE RM multi-loop temperature controller is the first EtherCAT device to pass conformance testing in North America. Watlow’s device passed conformance testing at the new North American EtherCAT Test Center based in Savage, Minnesota. Stan Breitlow, Watlow’s principal engineer and semiconductor system designer, accepted the award from Florian Hafele, the onsite representative from the EtherCAT Technology Group (ETG).
Watlow’s EZ-ZONE RM is rapidly becoming an industry standard due to its extreme flexibility and scalability allowing unparalleled mixing of inputs and outputs to configure control loops, limit loops and monitoring points. Watlow is deeply committed to the semiconductor industry as exemplified by the early adoption of EtherCAT. This major milestone in our control’s evolution now enables customers to integrate the latest generation of communications protocol to their tools.
For more information, visit www.watlow.com.